<?xml version="1.0"?>
<dblp>
<article key="journals/chinaf/HuangWKXSATWZZW09" mdate="2009-10-06">
<author>Ru Huang</author>
<author>HanMing Wu</author>
<author>JinFeng Kang</author>
<author>DeYuan Xiao</author>
<author>XueLong Shi</author>
<author>Xia An</author>
<author>Yu Tian</author>
<author>RunSheng Wang</author>
<author>LiangLiang Zhang</author>
<author>Xing Zhang</author>
<author>Yangyuan Wang</author>
<title>Challenges of 22 nm and beyond CMOS technology.</title>
<pages>1491-1533</pages>
<year>2009</year>
<volume>52</volume>
<journal>Science in China Series F: Information Sciences</journal>
<number>9</number>
<ee>http://dx.doi.org/10.1007/s11432-009-0167-9</ee>
<url>db/journals/chinaf/chinaf52.html#HuangWKXSATWZZW09</url>
</article>
</dblp>
