BibTeX record journals/chinaf/HuangCC16

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@article{DBLP:journals/chinaf/HuangCC16,
  author       = {Pengcheng Huang and
                  Shuming Chen and
                  Jianjun Chen},
  title        = {Single event upset induced by single event double transient and its
                  well-structure dependency in 65-nm bulk {CMOS} technology},
  journal      = {Sci. China Inf. Sci.},
  volume       = {59},
  number       = {4},
  pages        = {042411:1--042411:8},
  year         = {2016},
  url          = {https://doi.org/10.1007/s11432-015-5471-y},
  doi          = {10.1007/S11432-015-5471-Y},
  timestamp    = {Mon, 02 Mar 2020 16:31:47 +0100},
  biburl       = {https://dblp.org/rec/journals/chinaf/HuangCC16.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}

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