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BibTeX record journals/chinaf/ChengSQLLGXC21
@article{DBLP:journals/chinaf/ChengSQLLGXC21, author = {Ran Cheng and Ying Sun and Yiming Qu and Wei Liu and Fanyu Liu and Jianfeng Gao and Nuo Xu and Bing Chen}, title = {Nano-scaled transistor reliability characterization at nano-second regime}, journal = {Sci. China Inf. Sci.}, volume = {64}, number = {10}, year = {2021}, url = {https://doi.org/10.1007/s11432-020-3088-3}, doi = {10.1007/S11432-020-3088-3}, timestamp = {Fri, 12 Apr 2024 08:48:38 +0200}, biburl = {https://dblp.org/rec/journals/chinaf/ChengSQLLGXC21.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
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