BibTeX record journals/chinaf/CaiCKDLZ21

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@article{DBLP:journals/chinaf/CaiCKDLZ21,
  author       = {Linlin Cai and
                  Wangyong Chen and
                  Jinfeng Kang and
                  Gang Du and
                  Xiaoyan Liu and
                  Xing Zhang},
  title        = {A physics-based electromigration reliability model for interconnects
                  lifetime prediction},
  journal      = {Sci. China Inf. Sci.},
  volume       = {64},
  number       = {11},
  year         = {2021},
  url          = {https://doi.org/10.1007/s11432-020-3140-4},
  doi          = {10.1007/S11432-020-3140-4},
  timestamp    = {Wed, 29 Dec 2021 14:48:55 +0100},
  biburl       = {https://dblp.org/rec/journals/chinaf/CaiCKDLZ21.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}