BibTeX record journals/candie/ShinKK22

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@article{DBLP:journals/candie/ShinKK22,
  author       = {Wooksoo Shin and
                  Hyungu Kahng and
                  Seoung Bum Kim},
  title        = {Mixup-based classification of mixed-type defect patterns in wafer
                  bin maps},
  journal      = {Comput. Ind. Eng.},
  volume       = {167},
  pages        = {107996},
  year         = {2022},
  url          = {https://doi.org/10.1016/j.cie.2022.107996},
  doi          = {10.1016/J.CIE.2022.107996},
  timestamp    = {Sat, 30 Sep 2023 10:04:54 +0200},
  biburl       = {https://dblp.org/rec/journals/candie/ShinKK22.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}
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