BibTeX record journals/access/YuJP18

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@article{DBLP:journals/access/YuJP18,
  author       = {Yang Yu and
                  Yueming Jiang and
                  Xiyuan Peng},
  title        = {Multi-Frequency Test Generation for Incipient Faults in Analog Circuits
                  Based on the Aliasing Measuring Model},
  journal      = {{IEEE} Access},
  volume       = {6},
  pages        = {34724--34735},
  year         = {2018},
  url          = {https://doi.org/10.1109/ACCESS.2018.2849697},
  doi          = {10.1109/ACCESS.2018.2849697},
  timestamp    = {Thu, 30 Jul 2020 13:23:24 +0200},
  biburl       = {https://dblp.org/rec/journals/access/YuJP18.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}

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