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BibTeX record journals/access/YangXRDZ20
@article{DBLP:journals/access/YangXRDZ20, author = {Jing Yang and Yi Xu and Hai{-}Jun Rong and Shaoyi Du and Hongmei Zhang}, title = {A Method for Wafer Defect Detection Using Spatial Feature Points Guided Affine Iterative Closest Point Algorithm}, journal = {{IEEE} Access}, volume = {8}, pages = {79056--79068}, year = {2020}, url = {https://doi.org/10.1109/ACCESS.2020.2990535}, doi = {10.1109/ACCESS.2020.2990535}, timestamp = {Mon, 25 Oct 2021 08:02:42 +0200}, biburl = {https://dblp.org/rec/journals/access/YangXRDZ20.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
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