BibTeX record journals/access/WanWSF20

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@article{DBLP:journals/access/WanWSF20,
  author       = {Bo Wan and
                  Ye Wang and
                  Yutai Su and
                  Guicui Fu},
  title        = {Reliability Evaluation of Multi-Mechanism Failure for Semiconductor
                  Devices Using Physics-of-Failure Technique and Maximum Entropy Principle},
  journal      = {{IEEE} Access},
  volume       = {8},
  pages        = {188154--188170},
  year         = {2020},
  url          = {https://doi.org/10.1109/ACCESS.2020.3031022},
  doi          = {10.1109/ACCESS.2020.3031022},
  timestamp    = {Thu, 23 Sep 2021 11:45:47 +0200},
  biburl       = {https://dblp.org/rec/journals/access/WanWSF20.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}
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