BibTeX record journals/access/JiangLR21a

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@article{DBLP:journals/access/JiangLR21a,
  author       = {Dan Jiang and
                  Weihua Lin and
                  Nagarajan Raghavan},
  title        = {Semiconductor Manufacturing Final Test Yield Optimization and Wafer
                  Acceptance Test Parameter Inverse Design Using Multi-Objective Optimization
                  Algorithms},
  journal      = {{IEEE} Access},
  volume       = {9},
  pages        = {137655--137666},
  year         = {2021},
  url          = {https://doi.org/10.1109/ACCESS.2021.3117576},
  doi          = {10.1109/ACCESS.2021.3117576},
  timestamp    = {Wed, 03 Nov 2021 08:25:29 +0100},
  biburl       = {https://dblp.org/rec/journals/access/JiangLR21a.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}
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