BibTeX record conf/wsc/CarlettiMBSGYK20

download as .bib file

@inproceedings{DBLP:conf/wsc/CarlettiMBSGYK20,
  author       = {Mattia Carletti and
                  Marco Maggipinto and
                  Alessandro Beghi and
                  Gian Antonio Susto and
                  Natalie Gentner and
                  Yao Yang and
                  Andreas Kyek},
  title        = {Interpretable Anomaly Detection for Knowledge Discovery in Semiconductor
                  Manufacturing},
  booktitle    = {Winter Simulation Conference, {WSC} 2020, Orlando, FL, USA, December
                  14-18, 2020},
  pages        = {1875--1885},
  publisher    = {{IEEE}},
  year         = {2020},
  url          = {https://doi.org/10.1109/WSC48552.2020.9384026},
  doi          = {10.1109/WSC48552.2020.9384026},
  timestamp    = {Tue, 21 Mar 2023 20:52:08 +0100},
  biburl       = {https://dblp.org/rec/conf/wsc/CarlettiMBSGYK20.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}
a service of  Schloss Dagstuhl - Leibniz Center for Informatics

manage site settings

To protect your privacy, all features that rely on external API calls from your browser are turned off by default. You need to opt-in for them to become active. All settings here will be stored as cookies with your web browser. For more information see our F.A.Q.