BibTeX record conf/wifs/FanWC15

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@inproceedings{DBLP:conf/wifs/FanWC15,
  author       = {Wei Fan and
                  Kai Wang and
                  Fran{\c{c}}ois Cayre},
  title        = {General-purpose image forensics using patch likelihood under image
                  statistical models},
  booktitle    = {2015 {IEEE} International Workshop on Information Forensics and Security,
                  {WIFS} 2015, Roma, Italy, November 16-19, 2015},
  pages        = {1--6},
  publisher    = {{IEEE}},
  year         = {2015},
  url          = {https://doi.org/10.1109/WIFS.2015.7368606},
  doi          = {10.1109/WIFS.2015.7368606},
  timestamp    = {Wed, 16 Oct 2019 14:14:50 +0200},
  biburl       = {https://dblp.org/rec/conf/wifs/FanWC15.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}
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