BibTeX record conf/wcre/VancsicsGB20

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@inproceedings{DBLP:conf/wcre/VancsicsGB20,
  author       = {B{\'{e}}la Vancsics and
                  Tam{\'{a}}s Gergely and
                  {\'{A}}rp{\'{a}}d Besz{\'{e}}des},
  title        = {Simulating the Effect of Test Flakiness on Fault Localization Effectiveness},
  booktitle    = {{IEEE} Workshop on Validation, Analysis and Evolution of Software
                  Tests, VST@SANER 2020, London, ON, Canada, February 18, 2020},
  pages        = {28--35},
  publisher    = {{IEEE}},
  year         = {2020},
  url          = {https://doi.org/10.1109/VST50071.2020.9051636},
  doi          = {10.1109/VST50071.2020.9051636},
  timestamp    = {Tue, 21 Mar 2023 20:57:06 +0100},
  biburl       = {https://dblp.org/rec/conf/wcre/VancsicsGB20.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}

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