BibTeX record conf/wcre/LuVD20

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@inproceedings{DBLP:conf/wcre/LuVD20,
  author       = {Zhong Xi Lu and
                  Sten Vercammen and
                  Serge Demeyer},
  title        = {Semi-automatic Test Case Expansion for Mutation Testing},
  booktitle    = {{IEEE} Workshop on Validation, Analysis and Evolution of Software
                  Tests, VST@SANER 2020, London, ON, Canada, February 18, 2020},
  pages        = {1--7},
  publisher    = {{IEEE}},
  year         = {2020},
  url          = {https://doi.org/10.1109/VST50071.2020.9051637},
  doi          = {10.1109/VST50071.2020.9051637},
  timestamp    = {Thu, 14 Oct 2021 09:59:47 +0200},
  biburl       = {https://dblp.org/rec/conf/wcre/LuVD20.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}

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