BibTeX record conf/wcre/HuangCST23

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@inproceedings{DBLP:conf/wcre/HuangCST23,
  author       = {Rubing Huang and
                  Haibo Chen and
                  Weifeng Sun and
                  Dave Towey},
  editor       = {Tao Zhang and
                  Xin Xia and
                  Nicole Novielli},
  title        = {Extended Abstract of Candidate Test Set Reduction for Adaptive Random
                  Testing: An Overheads Reduction Technique},
  booktitle    = {{IEEE} International Conference on Software Analysis, Evolution and
                  Reengineering, {SANER} 2023, Taipa, Macao, March 21-24, 2023},
  pages        = {853--854},
  publisher    = {{IEEE}},
  year         = {2023},
  url          = {https://doi.org/10.1109/SANER56733.2023.00102},
  doi          = {10.1109/SANER56733.2023.00102},
  timestamp    = {Tue, 07 May 2024 20:11:25 +0200},
  biburl       = {https://dblp.org/rec/conf/wcre/HuangCST23.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}
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