BibTeX record conf/wacv/BetteBBLK22

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@inproceedings{DBLP:conf/wacv/BetteBBLK22,
  author       = {Ann{-}Christin Bette and
                  Patrick Brus and
                  G{\'{a}}bor Bal{\'{a}}zs and
                  Matthias Ludwig and
                  Alois C. Knoll},
  title        = {Automated Defect Inspection in Reverse Engineering of Integrated Circuits},
  booktitle    = {{IEEE/CVF} Winter Conference on Applications of Computer Vision, {WACV}
                  2022, Waikoloa, HI, USA, January 3-8, 2022},
  pages        = {1809--1818},
  publisher    = {{IEEE}},
  year         = {2022},
  url          = {https://doi.org/10.1109/WACV51458.2022.00187},
  doi          = {10.1109/WACV51458.2022.00187},
  timestamp    = {Mon, 15 Apr 2024 15:21:47 +0200},
  biburl       = {https://dblp.org/rec/conf/wacv/BetteBBLK22.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}
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