BibTeX record conf/vts/ZhuGJR21

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@inproceedings{DBLP:conf/vts/ZhuGJR21,
  author       = {Jinhua Zhu and
                  Zhen Gao and
                  Jie Jin and
                  Pedro Reviriego},
  title        = {Reliability Evaluation of the Count Min Sketch {(CMS)} against Single
                  Event Transients (SETs)},
  booktitle    = {39th {IEEE} {VLSI} Test Symposium, {VTS} 2021, San Diego, CA, USA,
                  April 25-28, 2021},
  pages        = {1--6},
  publisher    = {{IEEE}},
  year         = {2021},
  url          = {https://doi.org/10.1109/VTS50974.2021.9441036},
  doi          = {10.1109/VTS50974.2021.9441036},
  timestamp    = {Thu, 21 Jul 2022 15:18:45 +0200},
  biburl       = {https://dblp.org/rec/conf/vts/ZhuGJR21.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}

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