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BibTeX record conf/vts/ZhouGLA21
@inproceedings{DBLP:conf/vts/ZhouGLA21, author = {Ziqi Zhou and Ujjwal Guin and Peng Li and Vishwani D. Agrawal}, title = {Defect Characterization and Testing of Skyrmion-Based Logic Circuits}, booktitle = {39th {IEEE} {VLSI} Test Symposium, {VTS} 2021, San Diego, CA, USA, April 25-28, 2021}, pages = {1--7}, publisher = {{IEEE}}, year = {2021}, url = {https://doi.org/10.1109/VTS50974.2021.9441054}, doi = {10.1109/VTS50974.2021.9441054}, timestamp = {Wed, 09 Jun 2021 09:00:34 +0200}, biburl = {https://dblp.org/rec/conf/vts/ZhouGLA21.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
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