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BibTeX record conf/vts/ZhongWCC19
@inproceedings{DBLP:conf/vts/ZhongWCC19, author = {Zhanwei Zhong and Tom B. Wrigglesworth and Eugene M. Chow and Krishnendu Chakrabarty}, title = {Test-Cost Reduction for 2.5D ICs Using Microspring Technology for Die Attachment and Rework}, booktitle = {37th {IEEE} {VLSI} Test Symposium, {VTS} 2019, Monterey, CA, USA, April 23-25, 2019}, pages = {1--6}, publisher = {{IEEE}}, year = {2019}, url = {https://doi.org/10.1109/VTS.2019.8758669}, doi = {10.1109/VTS.2019.8758669}, timestamp = {Mon, 03 Jan 2022 22:16:24 +0100}, biburl = {https://dblp.org/rec/conf/vts/ZhongWCC19.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
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