BibTeX record conf/vts/ZhengYLWCKRR22

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@inproceedings{DBLP:conf/vts/ZhengYLWCKRR22,
  author       = {Shi{-}Xuan Zheng and
                  Chung{-}Yu Yeh and
                  Kuen{-}Jong Lee and
                  Chen Wang and
                  Wu{-}Tung Cheng and
                  Mark Kassab and
                  Janusz Rajski and
                  Sudhakar M. Reddy},
  title        = {Accurate Estimation of Test Pattern Counts for a Wide-Range of {EDT}
                  Input/Output Channel Configurations},
  booktitle    = {40th {IEEE} {VLSI} Test Symposium, {VTS} 2022, San Diego, CA, USA,
                  April 25-27, 2022},
  pages        = {1--7},
  publisher    = {{IEEE}},
  year         = {2022},
  url          = {https://doi.org/10.1109/VTS52500.2021.9794207},
  doi          = {10.1109/VTS52500.2021.9794207},
  timestamp    = {Wed, 22 Jun 2022 15:24:49 +0200},
  biburl       = {https://dblp.org/rec/conf/vts/ZhengYLWCKRR22.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}