BibTeX record conf/vts/ZhengBA96

download as .bib file

@inproceedings{DBLP:conf/vts/ZhengBA96,
  author       = {Hong Helena Zheng and
                  Ashok Balivada and
                  Jacob A. Abraham},
  title        = {A novel test generation approach for parametric faults in linear analog
                  circuits},
  booktitle    = {14th {IEEE} {VLSI} Test Symposium (VTS'96), April 28 - May 1, 1996,
                  Princeton, NJ, {USA}},
  pages        = {470--475},
  publisher    = {{IEEE} Computer Society},
  year         = {1996},
  url          = {https://doi.org/10.1109/VTEST.1996.510895},
  doi          = {10.1109/VTEST.1996.510895},
  timestamp    = {Fri, 24 Mar 2023 00:04:04 +0100},
  biburl       = {https://dblp.org/rec/conf/vts/ZhengBA96.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}
a service of  Schloss Dagstuhl - Leibniz Center for Informatics

manage site settings

To protect your privacy, all features that rely on external API calls from your browser are turned off by default. You need to opt-in for them to become active. All settings here will be stored as cookies with your web browser. For more information see our F.A.Q.