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BibTeX record conf/vts/YonedaSIIF07
@inproceedings{DBLP:conf/vts/YonedaSIIF07, author = {Tomokazu Yoneda and Akiko Shuto and Hideyuki Ichihara and Tomoo Inoue and Hideo Fujiwara}, title = {{TAM} Design and Optimization for Transparency-Based SoC Test}, booktitle = {25th {IEEE} {VLSI} Test Symposium {(VTS} 2007), 6-10 May 2007, Berkeley, California, {USA}}, pages = {381--388}, publisher = {{IEEE} Computer Society}, year = {2007}, url = {https://doi.org/10.1109/VTS.2007.78}, doi = {10.1109/VTS.2007.78}, timestamp = {Fri, 24 Mar 2023 00:04:04 +0100}, biburl = {https://dblp.org/rec/conf/vts/YonedaSIIF07.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
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