<?xml version="1.0"?>
<dblp>
<inproceedings key="conf/vts/YehLSWHL05" mdate="2006-01-23">
<author>Jen-Chieh Yeh</author>
<author>Yan-Ting Lai</author>
<author>Yuan-Yuan Shih</author>
<author>Cheng-Wen Wu</author>
<author>Chien-Hung Ho</author>
<author>Yen-Tai Lin</author>
<title>Flash Memory Built-In Self-Diagnosis with Test Mode Control.</title>
<pages>15-20</pages>
<year>2005</year>
<crossref>conf/vts/2005</crossref>
<booktitle>VTS</booktitle>
<ee>http://doi.ieeecomputersociety.org/10.1109/VTS.2005.45</ee>
<url>db/conf/vts/vts2005.html#YehLSWHL05</url>
</inproceedings>
</dblp>
