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BibTeX record conf/vts/YehLSWHL05
@inproceedings{DBLP:conf/vts/YehLSWHL05, author = {Jen{-}Chieh Yeh and Yan{-}Ting Lai and Yuan{-}Yuan Shih and Cheng{-}Wen Wu and Chien{-}Hung Ho and Yen{-}Tai Lin}, title = {Flash Memory Built-In Self-Diagnosis with Test Mode Control}, booktitle = {23rd {IEEE} {VLSI} Test Symposium {(VTS} 2005), 1-5 May 2005, Palm Springs, CA, {USA}}, pages = {15--20}, publisher = {{IEEE} Computer Society}, year = {2005}, url = {https://doi.org/10.1109/VTS.2005.45}, doi = {10.1109/VTS.2005.45}, timestamp = {Sat, 30 Sep 2023 09:58:40 +0200}, biburl = {https://dblp.org/rec/conf/vts/YehLSWHL05.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
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