<?xml version="1.0"?>
<dblp>
<inproceedings key="conf/vts/YangCDRP08" mdate="2008-05-07">
<author>Fan Yang</author>
<author>Sreejit Chakravarty</author>
<author>Narendra Devta-Prasanna</author>
<author>Sudhakar M. Reddy</author>
<author>Irith Pomeranz</author>
<title>On the Detectability of Scan Chain Internal Faults &#151; An Industrial Case Study.</title>
<pages>79-84</pages>
<year>2008</year>
<booktitle>VTS</booktitle>
<ee>http://doi.ieeecomputersociety.org/10.1109/VTS.2008.13</ee>
<crossref>conf/vts/2008</crossref>
<url>db/conf/vts/vts2008.html#YangCDRP08</url>
</inproceedings>
</dblp>
