WohlWKRGWJ07'

@inproceedings{DBLP:conf/vts/WohlWKRGWJ07,
  author    = {Peter Wohl and
               John A. Waicukauski and
               Rohit Kapur and
               Sanjay Ramnath and
               Emil Gizdarski and
               Thomas W. Williams and
               P. Jaini},
  title     = {Minimizing the Impact of Scan Compression},
  booktitle = {VTS},
  year      = {2007},
  pages     = {67-74},
  ee        = {http://dx.doi.org/10.1109/VTS.2007.38},
  crossref  = {DBLP:conf/vts/2007},
  bibsource = {DBLP, http://dblp.uni-trier.de}
}

@proceedings{DBLP:conf/vts/2007,
  title     = {25th IEEE VLSI Test Symposium (VTS 2007), 6-10 May 2007,
               Berkeley, California, USA},
  booktitle = {VTS},
  publisher = {IEEE Computer Society},
  year      = {2007},
  bibsource = {DBLP, http://dblp.uni-trier.de}
}