BibTeX record conf/vts/WilliamsS00

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@inproceedings{DBLP:conf/vts/WilliamsS00,
  author       = {Thomas W. Williams and
                  Stephen K. Sunter},
  title        = {How Should Fault Coverage Be Defined?},
  booktitle    = {18th {IEEE} {VLSI} Test Symposium {(VTS} 2000), 30 April - 4 May 2000,
                  Montreal, Canada},
  pages        = {325--328},
  publisher    = {{IEEE} Computer Society},
  year         = {2000},
  url          = {https://doi.ieeecomputersociety.org/10.1109/VTS.2000.10003},
  doi          = {10.1109/VTS.2000.10003},
  timestamp    = {Fri, 24 Mar 2023 00:04:04 +0100},
  biburl       = {https://dblp.org/rec/conf/vts/WilliamsS00.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}
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