BibTeX record conf/vts/WilliamsFL98

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@inproceedings{DBLP:conf/vts/WilliamsFL98,
  author       = {Douglas Williams and
                  F. Joel Ferguson and
                  Tracy Larrabee},
  title        = {A Study on the Utility of Using Expected Quality Level as a Design
                  for Testability Metric},
  booktitle    = {16th {IEEE} {VLSI} Test Symposium {(VTS} '98), 28 April - 1 May 1998,
                  Princeton, NJ, {USA}},
  pages        = {274--282},
  publisher    = {{IEEE} Computer Society},
  year         = {1998},
  url          = {https://doi.org/10.1109/VTEST.1998.670880},
  doi          = {10.1109/VTEST.1998.670880},
  timestamp    = {Fri, 24 Mar 2023 00:04:05 +0100},
  biburl       = {https://dblp.org/rec/conf/vts/WilliamsFL98.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}