DBLP Record 'conf/vts/WenYKWSK05'

BibTeX

@inproceedings{DBLP:conf/vts/WenYKWSK05,
  author    = {Xiaoqing Wen and
               Yoshiyuki Yamashita and
               Seiji Kajihara and
               Laung-Terng Wang and
               Kewal K. Saluja and
               Kozo Kinoshita},
  title     = {On Low-Capture-Power Test Generation for Scan Testing},
  booktitle = {VTS},
  year      = {2005},
  pages     = {265-270},
  ee        = {http://doi.ieeecomputersociety.org/10.1109/VTS.2005.60},
  crossref  = {DBLP:conf/vts/2005},
  bibsource = {DBLP, http://dblp.uni-trier.de}
}

@proceedings{DBLP:conf/vts/2005,
  title     = {23rd IEEE VLSI Test Symposium (VTS 2005), 1-5 May 2005,
               Palm Springs, CA, USA},
  booktitle = {VTS},
  publisher = {IEEE Computer Society},
  year      = {2005},
  isbn      = {0-7695-2314-5},
  bibsource = {DBLP, http://dblp.uni-trier.de}
}