Power-aware test generation with guaranteed launch safety for at-speed scan testing.

Xiaoqing Wen Kazunari Enokimoto Kohei Miyase Yuta Yamato Michael A. Kochte Seiji Kajihara Patrick Girard Mohammad Tehranipoor Power-aware test generation with guaranteed launch safety for at-speed scan testing. 166-171 2011 VTS http://dx.doi.org/10.1109/VTS.2011.5783778 conf/vts/2011 db/conf/vts/vts2011.html#WenEMYKKGT11