@inproceedings{DBLP:conf/vts/WenEMYKKGT11,
  author    = {Xiaoqing Wen and
               Kazunari Enokimoto and
               Kohei Miyase and
               Yuta Yamato and
               Michael A. Kochte and
               Seiji Kajihara and
               Patrick Girard and
               Mohammad Tehranipoor},
  title     = {Power-aware test generation with guaranteed launch safety
               for at-speed scan testing},
  booktitle = {VTS},
  year      = {2011},
  pages     = {166-171},
  ee        = {http://dx.doi.org/10.1109/VTS.2011.5783778},
  crossref  = {DBLP:conf/vts/2011},
  bibsource = {DBLP, http://dblp.uni-trier.de}
}

@proceedings{DBLP:conf/vts/2011,
  title     = {29th IEEE VLSI Test Symposium, VTS 2011, May 1-5, 2011,
               Dana Point, California, USA},
  booktitle = {VTS},
  publisher = {IEEE Computer Society},
  year      = {2011},
  bibsource = {DBLP, http://dblp.uni-trier.de}
}