@inproceedings{DBLP:conf/vts/WangYCIZ04,
  author    = {Baosheng Wang and
               Josh Yang and
               James Cicalo and
               Andr{\'e} Ivanov and
               Yervant Zorian},
  title     = {Reducing Embedded SRAM Test Time under Redundancy Constraints},
  booktitle = {VTS},
  year      = {2004},
  pages     = {237-242},
  ee        = {http://doi.ieeecomputersociety.org/10.1109/VTEST.2004.1299249},
  crossref  = {DBLP:conf/vts/2004},
  bibsource = {DBLP, http://dblp.uni-trier.de}
}

@proceedings{DBLP:conf/vts/2004,
  title     = {22nd IEEE VLSI Test Symposium (VTS 2004), 25-29 April 2004,
               Napa Valley, CA, USA},
  booktitle = {VTS},
  publisher = {IEEE Computer Society},
  year      = {2004},
  isbn      = {0-7695-2134-7},
  bibsource = {DBLP, http://dblp.uni-trier.de}
}