BibTeX record: conf/vts/WangYCIZ04

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@inproceedings{DBLP:conf/vts/WangYCIZ04,
  author    = {Baosheng Wang and
               Josh Yang and
               James Cicalo and
               Andr{\'{e}} Ivanov and
               Yervant Zorian},
  title     = {Reducing Embedded {SRAM} Test Time under Redundancy Constraints},
  booktitle = {22nd {IEEE} {VLSI} Test Symposium {(VTS} 2004), 25-29 April 2004,
               Napa Valley, CA, {USA}},
  year      = {2004},
  pages     = {237--242},
  crossref  = {DBLP:conf/vts/2004},
  url       = {http://doi.ieeecomputersociety.org/10.1109/VTEST.2004.1299249},
  doi       = {10.1109/VTEST.2004.1299249},
  timestamp = {Sat, 25 Oct 2014 21:10:57 +0200},
  biburl    = {http://dblp.uni-trier.de/rec/bib/conf/vts/WangYCIZ04},
  bibsource = {dblp computer science bibliography, http://dblp.org}
}
@proceedings{DBLP:conf/vts/2004,
  title     = {22nd {IEEE} {VLSI} Test Symposium {(VTS} 2004), 25-29 April 2004,
               Napa Valley, CA, {USA}},
  year      = {2004},
  publisher = {{IEEE} Computer Society},
  isbn      = {0-7695-2134-7},
  timestamp = {Sat, 25 Oct 2014 21:10:57 +0200},
  biburl    = {http://dblp.uni-trier.de/rec/bib/conf/vts/2004},
  bibsource = {dblp computer science bibliography, http://dblp.org}
}