BibTeX record conf/vts/VazquezCHS09

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@inproceedings{DBLP:conf/vts/VazquezCHS09,
  author       = {Julio C{\'{e}}sar V{\'{a}}zquez and
                  V{\'{\i}}ctor H. Champac and
                  Chuck Hawkins and
                  Jaume Segura},
  title        = {Stuck-Open Fault Leakage and Testing in Nanometer Technologies},
  booktitle    = {27th {IEEE} {VLSI} Test Symposium, {VTS} 2009, May 3-7, 2009, Santa
                  Cruz, California, {USA}},
  pages        = {315--320},
  publisher    = {{IEEE} Computer Society},
  year         = {2009},
  url          = {https://doi.org/10.1109/VTS.2009.33},
  doi          = {10.1109/VTS.2009.33},
  timestamp    = {Fri, 24 Mar 2023 00:04:05 +0100},
  biburl       = {https://dblp.org/rec/conf/vts/VazquezCHS09.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}

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