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BibTeX record conf/vts/UppaluriSP96
@inproceedings{DBLP:conf/vts/UppaluriSP96, author = {Prasanti Uppaluri and Uwe Sparmann and Irith Pomeranz}, title = {On minimizing the number of test points needed to achieve complete robust path delay fault testability}, booktitle = {14th {IEEE} {VLSI} Test Symposium (VTS'96), April 28 - May 1, 1996, Princeton, NJ, {USA}}, pages = {288--295}, publisher = {{IEEE} Computer Society}, year = {1996}, url = {https://doi.org/10.1109/VTEST.1996.510870}, doi = {10.1109/VTEST.1996.510870}, timestamp = {Fri, 24 Mar 2023 00:04:05 +0100}, biburl = {https://dblp.org/rec/conf/vts/UppaluriSP96.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
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