BibTeX record conf/vts/TsengHL10

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@inproceedings{DBLP:conf/vts/TsengHL10,
  author       = {Tsu{-}Wei Tseng and
                  Chih{-}Sheng Hou and
                  Jin{-}Fu Li},
  title        = {Automatic generation of memory built-in self-repair circuits in SOCs
                  for minimizing test time and area cost},
  booktitle    = {28th {IEEE} {VLSI} Test Symposium, {VTS} 2010, April 19-22, 2010,
                  Santa Cruz, California, {USA}},
  pages        = {21--26},
  publisher    = {{IEEE} Computer Society},
  year         = {2010},
  url          = {https://doi.org/10.1109/VTS.2010.5469627},
  doi          = {10.1109/VTS.2010.5469627},
  timestamp    = {Tue, 17 Oct 2023 15:22:33 +0200},
  biburl       = {https://dblp.org/rec/conf/vts/TsengHL10.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}
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