A Regression Based Technique for ATE-Aware Test Data Volume Estimation of System-on-Chips.

Rajesh Tiwari Abhijeet Shrivastava Mahit Warhadpande Srivaths Ravi Rubin A. Parekhji A Regression Based Technique for ATE-Aware Test Data Volume Estimation of System-on-Chips. 53-58 2008 VTS http://doi.ieeecomputersociety.org/10.1109/VTS.2008.62 conf/vts/2008 db/conf/vts/vts2008.html#TiwariSWRP08