default search action
BibTeX record conf/vts/TanL01
@inproceedings{DBLP:conf/vts/TanL01, author = {Tek Jau Tan and Chung{-}Len Lee}, title = {Socillator Test: {A} Delay Test Scheme for Embedded ICs in the Boundary-Scan Environment}, booktitle = {19th {IEEE} {VLSI} Test Symposium {(VTS} 2001), Test and Diagnosis in a Nanometric World, 29 April - 3 May 2001, Marina Del Rey, CA, {USA}}, pages = {158--162}, publisher = {{IEEE} Computer Society}, year = {2001}, url = {https://doi.org/10.1109/VTS.2001.923433}, doi = {10.1109/VTS.2001.923433}, timestamp = {Fri, 24 Mar 2023 00:04:04 +0100}, biburl = {https://dblp.org/rec/conf/vts/TanL01.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
manage site settings
To protect your privacy, all features that rely on external API calls from your browser are turned off by default. You need to opt-in for them to become active. All settings here will be stored as cookies with your web browser. For more information see our F.A.Q.