BibTeX
@inproceedings{DBLP:conf/vts/SyllaSKHV98,
author = {Iboun Taimiya Sylla and
Mustapha Slamani and
Bozena Kaminska and
Fartoumi M. Hossein and
Patrick Vincent},
title = {Impedance Mismatch and Lumped Capacitance Effects in High
Frequency Testing},
booktitle = {VTS},
year = {1998},
pages = {239-244},
ee = {http://csdl2.computer.org/dl/proceedings/vts/1998/8436/00/84360239.pdf},
crossref = {DBLP:conf/vts/1998},
bibsource = {DBLP, http://dblp.uni-trier.de}
}
@proceedings{DBLP:conf/vts/1998,
title = {16th IEEE VLSI Test Symposium (VTS '98), 28 April - 1 May
1998, Princeton, NJ, USA},
booktitle = {VTS},
publisher = {IEEE Computer Society},
year = {1998},
isbn = {0-8186-8436-4},
bibsource = {DBLP, http://dblp.uni-trier.de}
}
Copyright © 2007-09-18 by Michael Ley (ley@uni-trier.de)