BibTeX record conf/vts/SunterCBR14

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@inproceedings{DBLP:conf/vts/SunterCBR14,
  author       = {Stephen K. Sunter and
                  Steve Comen and
                  Paul Berndt and
                  Ram Rajamani},
  title        = {Innovative practices session 7C: Reduced pin-count testing - How low
                  can we go?},
  booktitle    = {32nd {IEEE} {VLSI} Test Symposium, {VTS} 2014, Napa, CA, USA, April
                  13-17, 2014},
  pages        = {1},
  publisher    = {{IEEE} Computer Society},
  year         = {2014},
  url          = {https://doi.org/10.1109/VTS.2014.6818778},
  doi          = {10.1109/VTS.2014.6818778},
  timestamp    = {Fri, 24 Mar 2023 00:04:04 +0100},
  biburl       = {https://dblp.org/rec/conf/vts/SunterCBR14.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}
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