DBLP BibTeX Record 'conf/vts/SunV01'

@inproceedings{DBLP:conf/vts/SunV01,
  author    = {Xiaoyun Sun and
               Bapiraju Vinnakota},
  title     = {Current Measurement for Dynamic Idd Test},
  booktitle = {VTS},
  year      = {2001},
  pages     = {117-123},
  ee        = {http://doi.ieeecomputersociety.org/10.1109/VTS.2001.923427},
  crossref  = {DBLP:conf/vts/2001},
  bibsource = {DBLP, http://dblp.uni-trier.de}
}

@proceedings{DBLP:conf/vts/2001,
  title     = {19th IEEE VLSI Test Symposium (VTS 2001), Test and Diagnosis
               in a Nanometric World, 29 April - 3 May 2001, Marina Del
               Rey, CA, USA},
  booktitle = {VTS},
  publisher = {IEEE Computer Society},
  year      = {2001},
  isbn      = {0-7695-1122-8},
  bibsource = {DBLP, http://dblp.uni-trier.de}
}

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