BibTeX record conf/vts/SpinnerPEBKC08

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@inproceedings{DBLP:conf/vts/SpinnerPEBKC08,
  author       = {Stefan Spinner and
                  Ilia Polian and
                  Piet Engelke and
                  Bernd Becker and
                  Martin Keim and
                  Wu{-}Tung Cheng},
  title        = {Automatic Test Pattern Generation for Interconnect Open Defects},
  booktitle    = {26th {IEEE} {VLSI} Test Symposium {(VTS} 2008), April 27 - May 1,
                  2008, San Diego, California, {USA}},
  pages        = {181--186},
  publisher    = {{IEEE} Computer Society},
  year         = {2008},
  url          = {https://doi.org/10.1109/VTS.2008.30},
  doi          = {10.1109/VTS.2008.30},
  timestamp    = {Fri, 24 Mar 2023 00:04:05 +0100},
  biburl       = {https://dblp.org/rec/conf/vts/SpinnerPEBKC08.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}
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