BibTeX record conf/vts/SparkmanSD20

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@inproceedings{DBLP:conf/vts/SparkmanSD20,
  author       = {Brett Sparkman and
                  Scott C. Smith and
                  Jia Di},
  title        = {Built-In Self-Test for Multi-Threshold {NULL} Convention Logic Asynchronous
                  Circuits},
  booktitle    = {38th {IEEE} {VLSI} Test Symposium, {VTS} 2020, San Diego, CA, USA,
                  April 5-8, 2020},
  pages        = {1--6},
  publisher    = {{IEEE}},
  year         = {2020},
  url          = {https://doi.org/10.1109/VTS48691.2020.9107627},
  doi          = {10.1109/VTS48691.2020.9107627},
  timestamp    = {Thu, 25 Jun 2020 15:54:32 +0200},
  biburl       = {https://dblp.org/rec/conf/vts/SparkmanSD20.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}
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