BibTeX record conf/vts/SivaramanS96

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@inproceedings{DBLP:conf/vts/SivaramanS96,
  author       = {Mukund Sivaraman and
                  Andrzej J. Strojwas},
  title        = {A diagnosability metric for parametric path delay faults},
  booktitle    = {14th {IEEE} {VLSI} Test Symposium (VTS'96), April 28 - May 1, 1996,
                  Princeton, NJ, {USA}},
  pages        = {316--323},
  publisher    = {{IEEE} Computer Society},
  year         = {1996},
  url          = {https://doi.org/10.1109/VTEST.1996.510874},
  doi          = {10.1109/VTEST.1996.510874},
  timestamp    = {Fri, 24 Mar 2023 00:04:05 +0100},
  biburl       = {https://dblp.org/rec/conf/vts/SivaramanS96.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}
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