BibTeX record conf/vts/SiatkowskiSWSDC16

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@inproceedings{DBLP:conf/vts/SiatkowskiSWSDC16,
  author       = {Sebastian Siatkowski and
                  Chuanhe Jay Shan and
                  Li{-}C. Wang and
                  Nikolas Sumikawa and
                  W. Robert Daasch and
                  John M. Carulli},
  title        = {Consistency in wafer based outlier screening},
  booktitle    = {34th {IEEE} {VLSI} Test Symposium, {VTS} 2016, Las Vegas, NV, USA,
                  April 25-27, 2016},
  pages        = {1--6},
  publisher    = {{IEEE} Computer Society},
  year         = {2016},
  url          = {https://doi.org/10.1109/VTS.2016.7477267},
  doi          = {10.1109/VTS.2016.7477267},
  timestamp    = {Fri, 24 Mar 2023 00:04:04 +0100},
  biburl       = {https://dblp.org/rec/conf/vts/SiatkowskiSWSDC16.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}
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