BibTeX record: conf/vts/ShanmugasundaramA11

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@inproceedings{DBLP:conf/vts/ShanmugasundaramA11,
  author    = {Priyadharshini Shanmugasundaram and
               Vishwani D. Agrawal},
  title     = {Dynamic scan clock control for test time reduction maintaining peak
               power limit},
  booktitle = {29th {IEEE} {VLSI} Test Symposium, {VTS} 2011, May 1-5, 2011, Dana
               Point, California, {USA}},
  year      = {2011},
  pages     = {248--253},
  crossref  = {DBLP:conf/vts/2011},
  url       = {http://dx.doi.org/10.1109/VTS.2011.5783729},
  doi       = {10.1109/VTS.2011.5783729},
  timestamp = {Sun, 26 Oct 2014 05:44:20 +0100},
  biburl    = {http://dblp.uni-trier.de/rec/bib/conf/vts/ShanmugasundaramA11},
  bibsource = {dblp computer science bibliography, http://dblp.org}
}
@proceedings{DBLP:conf/vts/2011,
  title     = {29th {IEEE} {VLSI} Test Symposium, {VTS} 2011, May 1-5, 2011, Dana
               Point, California, {USA}},
  year      = {2011},
  publisher = {{IEEE} Computer Society},
  timestamp = {Sun, 26 Oct 2014 05:44:20 +0100},
  biburl    = {http://dblp.uni-trier.de/rec/bib/conf/vts/2011},
  bibsource = {dblp computer science bibliography, http://dblp.org}
}