ShanmugasundaramA11'

@inproceedings{DBLP:conf/vts/ShanmugasundaramA11,
  author    = {Priyadharshini Shanmugasundaram and
               Vishwani D. Agrawal},
  title     = {Dynamic scan clock control for test time reduction maintaining
               peak power limit},
  booktitle = {VTS},
  year      = {2011},
  pages     = {248-253},
  ee        = {http://dx.doi.org/10.1109/VTS.2011.5783729},
  crossref  = {DBLP:conf/vts/2011},
  bibsource = {DBLP, http://dblp.uni-trier.de}
}

@proceedings{DBLP:conf/vts/2011,
  title     = {29th IEEE VLSI Test Symposium, VTS 2011, May 1-5, 2011,
               Dana Point, California, USA},
  booktitle = {VTS},
  publisher = {IEEE Computer Society},
  year      = {2011},
  bibsource = {DBLP, http://dblp.uni-trier.de}
}