SchuttertJK02'

@inproceedings{DBLP:conf/vts/SchuttertJK02,
  author    = {Rodger Schuttert and
               Frans de Jong and
               Ben Kup},
  title     = {Improved Test Monitor Circuit in Power Pin DfT},
  booktitle = {VTS},
  year      = {2002},
  pages     = {345-350},
  ee        = {http://doi.ieeecomputersociety.org/10.1109/VTS.2002.1011163},
  crossref  = {DBLP:conf/vts/2002},
  bibsource = {DBLP, http://dblp.uni-trier.de}
}

@proceedings{DBLP:conf/vts/2002,
  title     = {20th IEEE VLSI Test Symposium (VTS 2002), Without Testing
               It's a Gamble, 28 April -  2 May 2002, Monterey, CA, USA},
  booktitle = {VTS},
  publisher = {IEEE Computer Society},
  year      = {2002},
  isbn      = {0-7695-1570-3},
  bibsource = {DBLP, http://dblp.uni-trier.de}
}