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BibTeX record conf/vts/QianHS12
@inproceedings{DBLP:conf/vts/QianHS12, author = {Xi Qian and Chao Han and Adit D. Singh}, title = {Detection of gate-oxide defects with timing tests at reduced power supply}, booktitle = {30th {IEEE} {VLSI} Test Symposium, {VTS} 2012, Maui, Hawaii, USA, 23-26 April 2012}, pages = {120--126}, publisher = {{IEEE} Computer Society}, year = {2012}, url = {https://doi.org/10.1109/VTS.2012.6231090}, doi = {10.1109/VTS.2012.6231090}, timestamp = {Wed, 16 Oct 2019 14:14:54 +0200}, biburl = {https://dblp.org/rec/conf/vts/QianHS12.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
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