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BibTeX record conf/vts/PrepinD97
@inproceedings{DBLP:conf/vts/PrepinD97, author = {V. Prepin and R. David}, title = {Fault coverage of a long random test sequence estimated from a short simulation}, booktitle = {15th {IEEE} {VLSI} Test Symposium (VTS'97), April 27-May 1, 1997, Monterey, California, {USA}}, pages = {391--398}, publisher = {{IEEE} Computer Society}, year = {1997}, url = {https://doi.org/10.1109/VTEST.1997.600315}, doi = {10.1109/VTEST.1997.600315}, timestamp = {Fri, 24 Mar 2023 00:04:05 +0100}, biburl = {https://dblp.org/rec/conf/vts/PrepinD97.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
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