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BibTeX record conf/vts/OuyangPZQTKHW23
@inproceedings{DBLP:conf/vts/OuyangPZQTKHW23, author = {Keqing Ouyang and Minqiang Peng and Yunnong Zhu and Kang Qi and Grigor Tshagharyan and Arun Kumar and Gurgen Harutyunyan and Isaac Wang}, title = {An Efficient External Memory Test Solution: Case Study for {HPC} Application}, booktitle = {41st {IEEE} {VLSI} Test Symposium, {VTS} 2023, San Diego, CA, USA, April 24-26, 2023}, pages = {1--4}, publisher = {{IEEE}}, year = {2023}, url = {https://doi.org/10.1109/VTS56346.2023.10139991}, doi = {10.1109/VTS56346.2023.10139991}, timestamp = {Fri, 09 Jun 2023 15:18:15 +0200}, biburl = {https://dblp.org/rec/conf/vts/OuyangPZQTKHW23.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
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