NakamuraSF06'

BibTeX

@inproceedings{DBLP:conf/vts/NakamuraSF06,
  author    = {Yoshiyuki Nakamura and
               Jacob Savir and
               Hideo Fujiwara},
  title     = {BIST Pretest of ICs: Risks and Benefits},
  booktitle = {VTS},
  year      = {2006},
  pages     = {142-149},
  ee        = {http://doi.ieeecomputersociety.org/10.1109/VTS.2006.23},
  crossref  = {DBLP:conf/vts/2006},
  bibsource = {DBLP, http://dblp.uni-trier.de}
}

@proceedings{DBLP:conf/vts/2006,
  title     = {24th IEEE VLSI Test Symposium (VTS 2006), 30 April - 4 May
               2006, Berkeley, California, USA},
  booktitle = {VTS},
  publisher = {IEEE Computer Society},
  year      = {2006},
  isbn      = {0-7695-2514-8},
  bibsource = {DBLP, http://dblp.uni-trier.de}
}