BibTeX
@inproceedings{DBLP:conf/vts/MullinsATKGBR07,
author = {Brian Mullins and
Hossein Asadi and
Mehdi Baradaran Tahoori and
David R. Kaeli and
Kevin Granlund and
Rudy Bauer and
Scott Romano},
title = {Case Study: Soft Error Rate Analysis in Storage Systems},
booktitle = {VTS},
year = {2007},
pages = {256-264},
ee = {http://dx.doi.org/10.1109/VTS.2007.21},
crossref = {DBLP:conf/vts/2007},
bibsource = {DBLP, http://dblp.uni-trier.de}
}
@proceedings{DBLP:conf/vts/2007,
title = {25th IEEE VLSI Test Symposium (VTS 2007), 6-10 May 2007,
Berkeley, California, USA},
booktitle = {VTS},
publisher = {IEEE Computer Society},
year = {2007},
bibsource = {DBLP, http://dblp.uni-trier.de}
}
Copyright © 2007-06-04 by Michael Ley (ley@uni-trier.de)